Measurement of equilibrium elemental vapor pressures using x-ray induced fluorescence

Published

March 22, 2011

Author(s)

John J. Curry, Albert Henins, E. G. Estupinan, W. P. Lapatovich, S. D. Shastri

Abstract

X-ray induced fluorescence is demonstrated as a fast and accurate method for measuring elemental vapor pressures over a wide range of pressures. As such, it may offer a preferable alternative to existing methods such as those based on effusion. Measurements were made at the Advanced Photon Source on Beamline 1-ID, where the elemental vapor pressures of Dy over DyI$_3$ and Tm over TmI$_3$ were obtained across the range of partial pressures from 300 mtorr to 700 torr. The results agree well with existing data, but extend to considerably higher temperature and pressure. Individual data points were obtained in time periods ranging from 10 s to 30 s each. The estimated random uncertainties in the measured pressures range from $\pm$ 40 \% at 300 mtorr to $

Citation

Chemical Physics Letters

Volume

507

Pub Type

Journals

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Keywords

fluorescence, lighting, measurement, metal-halide, pressure, synchrotron, technique, vapor, x ray

Citation

Curry, J. , Henins, A. , Estupinan, E. , Lapatovich, W. and Shastri, S. (2011), Measurement of equilibrium elemental vapor pressures using x-ray induced fluorescence, Chemical Physics Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=905739 (Accessed October 9, 2025)