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Measurement of equilibrium elemental vapor pressures using x-ray induced fluorescence

Published

Author(s)

John J. Curry, Albert Henins, E. G. Estupinan, W. P. Lapatovich, S. D. Shastri

Abstract

X-ray induced fluorescence is demonstrated as a fast and accurate method for measuring elemental vapor pressures over a wide range of pressures. As such, it may offer a preferable alternative to existing methods such as those based on effusion. Measurements were made at the Advanced Photon Source on Beamline 1-ID, where the elemental vapor pressures of Dy over DyI$_3$ and Tm over TmI$_3$ were obtained across the range of partial pressures from 300 mtorr to 700 torr. The results agree well with existing data, but extend to considerably higher temperature and pressure. Individual data points were obtained in time periods ranging from 10 s to 30 s each. The estimated random uncertainties in the measured pressures range from $\pm$ 40 \% at 300 mtorr to $
Citation
Chemical Physics Letters
Volume
507

Keywords

fluorescence, lighting, measurement, metal-halide, pressure, synchrotron, technique, vapor, x ray

Citation

Curry, J. , Henins, A. , Estupinan, E. , Lapatovich, W. and Shastri, S. (2011), Measurement of equilibrium elemental vapor pressures using x-ray induced fluorescence, Chemical Physics Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=905739 (Accessed June 23, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created March 22, 2011, Updated February 19, 2017