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Mapping the Elastic Properties of Granular Au Films by Contact Resonance Atomic Force Microscopy

Published

Author(s)

Gheorghe Stan, Robert F. Cook

Abstract

Endowed with nanoscale spatial resolution, contact resonance atomic force microscopy (CR-AFM) provides extremely localized elastic property measurements. We advance here the applicability of CR-AFM on surfaces with nanosize features by considering the topography contribution to the CR-AFM signal. On nanosize granular Au films, the elastic modulus at the grain scale has been mapped out by considering a self-consistent deconvolution of the contact geometry effect in the CR-AFM image. Significant variation in the contact area over granular topography arises as the probe is either in single- or multiple-asperity contact with the surface. Consequently, in extracting the elastic modulus from CR-AFM measurements on granular surfaces we considered both the normal and lateral couplings established through multi-asperity contacts between the tip and the surface.
Citation
Nanotechnology
Volume
19

Keywords

mechanical properties, nanoscale

Citation

Stan, G. and Cook, R. (2008), Mapping the Elastic Properties of Granular Au Films by Contact Resonance Atomic Force Microscopy, Nanotechnology, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=853572 (Accessed May 27, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created November 13, 2008, Updated February 19, 2017