Stan, G.
and Cook, R.
(2008),
Mapping the Elastic Properties of Granular Au Films by Contact Resonance Atomic Force Microscopy, Nanotechnology, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=853572
(Accessed December 10, 2024)
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Mapping the Elastic Properties of Granular Au Films by Contact Resonance Atomic Force Microscopy
Published
Author(s)
,
Abstract
Endowed with nanoscale spatial resolution, contact resonance atomic force microscopy (CR-AFM) provides extremely localized elastic property measurements. We advance here the applicability of CR-AFM on surfaces with nanosize features by considering the topography contribution to the CR-AFM signal. On nanosize granular Au films, the elastic modulus at the grain scale has been mapped out by considering a self-consistent deconvolution of the contact geometry effect in the CR-AFM image. Significant variation in the contact area over granular topography arises as the probe is either in single- or multiple-asperity contact with the surface. Consequently, in extracting the elastic modulus from CR-AFM measurements on granular surfaces we considered both the normal and lateral couplings established through multi-asperity contacts between the tip and the surface.Citation
Nanotechnology
Volume
19
Pub Type
Journals
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Keywords
mechanical properties, nanoscale
Citation
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Created November 13, 2008, Updated February 19, 2017