Mapping the Elastic Properties of Granular Au Films by Contact Resonance Atomic Force Microscopy
Gheorghe Stan, Robert F. Cook
Endowed with nanoscale spatial resolution, contact resonance atomic force microscopy (CR-AFM) provides extremely localized elastic property measurements. We advance here the applicability of CR-AFM on surfaces with nanosize features by considering the topography contribution to the CR-AFM signal. On nanosize granular Au films, the elastic modulus at the grain scale has been mapped out by considering a self-consistent deconvolution of the contact geometry effect in the CR-AFM image. Significant variation in the contact area over granular topography arises as the probe is either in single- or multiple-asperity contact with the surface. Consequently, in extracting the elastic modulus from CR-AFM measurements on granular surfaces we considered both the normal and lateral couplings established through multi-asperity contacts between the tip and the surface.
and Cook, R.
Mapping the Elastic Properties of Granular Au Films by Contact Resonance Atomic Force Microscopy, Nanotechnology, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=853572
(Accessed September 21, 2023)