McMichael, R.
, Kunz, A.
and Twisselmann, D.
(2003),
Localized Ferromagnetic Resonance in Inhomogeneous Thin Films, Physical Review Letters
(Accessed June 17, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Localized Ferromagnetic Resonance in Inhomogeneous Thin Films
Published
Author(s)
, A Kunz,
Abstract
The effect of sample inhomogeneity on the ferromagnetic resonance line width is determined by diagonalization of a spin wave Hamiltonian for ferromagnetic thin films with inhomogeneities. The resonance line broadening results from the distribution of the ferromagnetic resonance intensity over a large number of normal modes that span a range of eigenfrequencies. For a model inhomogeneity consisting of an applied field, dp} that varies randomly from grain to grain, the resulting line width agrees well with the two magnon model for small grains. For large grains the precession becomes localized and the spectrum approaches that the independent grains.Citation
Physical Review Letters
Volume
90
Issue
No. 22
Pub Type
Journals
Keywords
ferromagnetic, ferromagnetic resonance, inhomogeneous thin films, magnetization damping
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created May 31, 2003, Updated October 12, 2021