Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Localized Ferromagnetic Resonance in Inhomogeneous Thin Films



Robert McMichael, A Kunz, D J. Twisselmann


The effect of sample inhomogeneity on the ferromagnetic resonance line width is determined by diagonalization of a spin wave Hamiltonian for ferromagnetic thin films with inhomogeneities. The resonance line broadening results from the distribution of the ferromagnetic resonance intensity over a large number of normal modes that span a range of eigenfrequencies. For a model inhomogeneity consisting of an applied field, dp} that varies randomly from grain to grain, the resulting line width agrees well with the two magnon model for small grains. For large grains the precession becomes localized and the spectrum approaches that the independent grains.
Physical Review Letters
No. 22


ferromagnetic, ferromagnetic resonance, inhomogeneous thin films, magnetization damping


McMichael, R. , Kunz, A. and Twisselmann, D. (2003), Localized Ferromagnetic Resonance in Inhomogeneous Thin Films, Physical Review Letters (Accessed July 21, 2024)


If you have any questions about this publication or are having problems accessing it, please contact

Created May 31, 2003, Updated October 12, 2021