Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

In-Line Dielectric Monitoring During Extrusion of Filled Polymers

Published

Author(s)

Anthony J. Bur, S C. Roth, M M. McBrearty

Abstract

Dielectric measurements were made on clay filled polyethylene-ethyl vinyl acetate (EVA) copolymer nanocomposites during processing by extrusion. The results show that composites containing chemically treated clays display significant dielectric dispersions. The addition of natural clay to the EVA copolymer increased the dielectric constant or relative permittivity above that of the EVA copolymer but did not increase the conductivity or cause any dispersion. The chemically treated clays, which are known to exfoliate in the composite with EVA copolymer, gave substantially higher relative permitivity and conductivity and distinct variations with frequency consistent with dielectric relaxations at frequencies below 3000Hz. One clay treatment gave a larger dielectric dispersion than the other.
Proceedings Title
Proceedings of the Society of Plastics Engineers Annual Technical Meeting
Volume
73 No. 5
Issue
No. 5
Conference Dates
May 1, 2001
Conference Location
Dallas, TX
Conference Title
Society of Plastics Engineers

Keywords

clay nanocomposite, dielectric constant, dielectric dispersion, polyethylene ethyl vinyl acetate

Citation

Bur, A. , Roth, S. and McBrearty, M. (2002), In-Line Dielectric Monitoring During Extrusion of Filled Polymers, Proceedings of the Society of Plastics Engineers Annual Technical Meeting, Dallas, TX, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=851850 (Accessed December 3, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created May 1, 2002, Updated February 19, 2017