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Lateral force microscope calibration using pivot loading of rectangular cantilevers



Koo-Hyun Chung, Mark Reitsma


This note outlines a calibration method for atomic force microscope friction measurement that uses the pivot method of Bogdanovic et al [Colloids Surf. B 19, 397 (2000)] to generate optical lever sensitivities for known torque applied to rectangular cantilevers. We demonstrate the key calibration parameter to be a linear function of the position at which it is determined along the length of cantilevers. In this way the optical lever system can be calibrated by applying loads at a distance along the length of a given cantilever, away from the integrated tip, to avoid issues such as tip damage or interference.
Review of Scientific Instruments


Atomic Force Microscopy, Lateral Force


Chung, K. and Reitsma, M. (2010), Lateral force microscope calibration using pivot loading of rectangular cantilevers, Review of Scientific Instruments (Accessed July 12, 2024)


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Created February 5, 2010, Updated February 19, 2017