Lateral force microscope calibration using pivot loading of rectangular cantilevers
Koo-Hyun Chung, Mark Reitsma
This note outlines a calibration method for atomic force microscope friction measurement that uses the pivot method of Bogdanovic et al [Colloids Surf. B 19, 397 (2000)] to generate optical lever sensitivities for known torque applied to rectangular cantilevers. We demonstrate the key calibration parameter to be a linear function of the position at which it is determined along the length of cantilevers. In this way the optical lever system can be calibrated by applying loads at a distance along the length of a given cantilever, away from the integrated tip, to avoid issues such as tip damage or interference.