Chung, K.
and Reitsma, M.
(2010),
Lateral force microscope calibration using pivot loading of rectangular cantilevers, Review of Scientific Instruments
(Accessed July 3, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Lateral force microscope calibration using pivot loading of rectangular cantilevers
Published
Author(s)
,
Abstract
This note outlines a calibration method for atomic force microscope friction measurement that uses the pivot method of Bogdanovic et al [Colloids Surf. B 19, 397 (2000)] to generate optical lever sensitivities for known torque applied to rectangular cantilevers. We demonstrate the key calibration parameter to be a linear function of the position at which it is determined along the length of cantilevers. In this way the optical lever system can be calibrated by applying loads at a distance along the length of a given cantilever, away from the integrated tip, to avoid issues such as tip damage or interference.Citation
Review of Scientific Instruments
Volume
81
Pub Type
Journals
Keywords
Atomic Force Microscopy, Lateral Force
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created February 5, 2010, Updated February 19, 2017