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Lateral force microscope calibration using pivot loading of rectangular cantilevers

Published

Author(s)

Koo-Hyun Chung, Mark Reitsma

Abstract

This note outlines a calibration method for atomic force microscope friction measurement that uses the pivot method of Bogdanovic et al [Colloids Surf. B 19, 397 (2000)] to generate optical lever sensitivities for known torque applied to rectangular cantilevers. We demonstrate the key calibration parameter to be a linear function of the position at which it is determined along the length of cantilevers. In this way the optical lever system can be calibrated by applying loads at a distance along the length of a given cantilever, away from the integrated tip, to avoid issues such as tip damage or interference.
Citation
Review of Scientific Instruments
Volume
81

Keywords

Atomic Force Microscopy, Lateral Force

Citation

Chung, K. and Reitsma, M. (2010), Lateral force microscope calibration using pivot loading of rectangular cantilevers, Review of Scientific Instruments (Accessed February 29, 2024)
Created February 5, 2010, Updated February 19, 2017