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Latent Fingerprint Performance Modeling

Published

Author(s)

Vladimir N. Dvornychenko

Abstract

This paper describes aspects of work done at NIST, in concert with the latent fingerprint community, toward achieving a partial lights-out latent fingerprint processing capability. The initial steps are to quantify performance over a cross-section of latent fingerprint matchers using representative latent fingerprints. This will give a clearer picture of the state of the art, and where the weaknesses lie. Analytic tools for modeling latent system performance are presented. Covered are: the selection of test dataset size (both search and background); methods of projecting to a ¿fully populated¿ system; and modeling errors. It is shown that when modeling errors are taken into account ¿bigger is better¿ may not always apply to dataset size.
Proceedings Title
IS&T/SPIE 20th Annual Symposium: Electronic Imaging, Science & Technology
Conference Dates
January 28-31, 2008
Conference Location
San Jose, CA
Conference Title
SPIE Electronic Imaging Conference

Keywords

Latent fingerprints, automated fingerprint searches, lights-out, performance modeling

Citation

Dvornychenko, V. (2008), Latent Fingerprint Performance Modeling, IS&T/SPIE 20th Annual Symposium: Electronic Imaging, Science & Technology, San Jose, CA (Accessed February 22, 2024)
Created January 14, 2008, Updated February 19, 2017