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Investigating electromagnetically induced transparency spectral lineshape distortion due to non-uniform fields in Rydberg-atom electrometry

Published

Author(s)

Drew Rotunno, Samuel Berweger, Nik Prajapati, Aly Artusio-Glimpse, MATTHEW SIMONS, chris holloway, Amy Robinson

Abstract

We investigate the effects of spatially non-uniform radio-frequency electric (E) field amplitudes on the spectral line shapes of electromagnetically induced transparency (EIT) signals in Rydberg atomic systems used in electrometry (i.e., the metrology of E-field strengths). Spatially non-uniform fields distort the EIT spectra from that of an ideal case, and understanding this distortion is important in the development of Rydberg atom-based sensors, as these distortions can limit accuracy and sensitivity. To characterize this distortion, we present a model that approximates the atom vapor as multi-layered media and then uses Beer's law to combine the absorption through its many discrete thin segments. We present a set of expected line distortions caused by various RF electric-field distributions found in practice. This provides an intuitive diagnostic tool for experiments. We compare this model to measured experimental atomic spectra in both two-photon and three-photon excitation schemes in the presence of non-uniform radio-frequency fields. We show that we can accurately model and reproduce the EIT lineshape distortion observed in these experimental data.
Citation
Journal of Applied Physics
Volume
134
Issue
8

Keywords

electrometry, rydberg atoms, spectroscopy

Citation

Rotunno, D. , Berweger, S. , Prajapati, N. , Artusio-Glimpse, A. , SIMONS, M. , holloway, C. and Robinson, A. (2023), Investigating electromagnetically induced transparency spectral lineshape distortion due to non-uniform fields in Rydberg-atom electrometry, Journal of Applied Physics, [online], https://doi.org/10.1063/5.0161213, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=935160 (Accessed December 7, 2024)

Issues

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Created August 25, 2023, Updated August 29, 2023