Intrinsic Damping and Intentional Ferromagnetic Resonance Broadening in Thin Permalloy Films

Published

May 1, 2003

Author(s)

D J. Twisselmann, Robert D. McMichael

Abstract

Detailed ferromagnetic resonance measurements on the thin Ni{₈₀}Fe{₂₀} films are described that determine characteristics of intrinsic damping and the effects of intentionally created defects on linewidth. Measurements are made as a function of frequency with magnetization oriented in-plane and normal to the plane. For nominally uniform films, the ferromagnetic resonance linewidth is linear in frequency for both in-plane and normal magnetization and is well described by Landau-Lifshitz damping with a constant damping parameter. The effect of inhomogeneity was investigated by deposited the Ni{₈₀}Fe{₂₀} films on specially prepared substrates, one with parallel random grooves and one with polycrystalline, antiferromagnetic NiO. The linewidth in these samples is generally larger with magnetization in-plane than with magnetization normal. In the NiO/Ni{₈₀}Fe{₂₀} film the in-plane line width is linear in frequency with a significant zero-frequency linewidth. In the Ni₈₀Fe₂₀ sample on the grooved substrate, the linewidth has a more complicated frequency dependence.

Citation

Journal of Applied Physics

Volume

93

Issue

No 10 Part 2

Pub Type

Journals

Keywords

antiferromagnetic, ferromagentic resonance boradening, intrinsic damping, magnetization, Permalloy films

Citation

Twisselmann, D. and McMichael, R. (2003), Intrinsic Damping and Intentional Ferromagnetic Resonance Broadening in Thin Permalloy Films, Journal of Applied Physics (Accessed April 26, 2025)