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Intrinsic Damping and Intentional Ferromagnetic Resonance Broadening in Thin Permalloy Films



D J. Twisselmann, Robert D. McMichael


Detailed ferromagnetic resonance measurements on the thin Ni{80}Fe{20} films are described that determine characteristics of intrinsic damping and the effects of intentionally created defects on linewidth. Measurements are made as a function of frequency with magnetization oriented in-plane and normal to the plane. For nominally uniform films, the ferromagnetic resonance linewidth is linear in frequency for both in-plane and normal magnetization and is well described by Landau-Lifshitz damping with a constant damping parameter. The effect of inhomogeneity was investigated by deposited the Ni{80}Fe{20} films on specially prepared substrates, one with parallel random grooves and one with polycrystalline, antiferromagnetic NiO. The linewidth in these samples is generally larger with magnetization in-plane than with magnetization normal. In the NiO/Ni{80}Fe{20} film the in-plane line width is linear in frequency with a significant zero-frequency linewidth. In the Ni80Fe20 sample on the grooved substrate, the linewidth has a more complicated frequency dependence.
Journal of Applied Physics
No 10 Part 2


antiferromagnetic, ferromagentic resonance boradening, intrinsic damping, magnetization, Permalloy films


Twisselmann, D. and McMichael, R. (2003), Intrinsic Damping and Intentional Ferromagnetic Resonance Broadening in Thin Permalloy Films, Journal of Applied Physics (Accessed June 20, 2024)


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Created May 1, 2003, Updated February 19, 2017