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Intrinsic Damping and Intentional Ferromagnetic Resonance Broadening in Thin Permalloy Films
Published
Author(s)
D J. Twisselmann, Robert D. McMichael
Abstract
Detailed ferromagnetic resonance measurements on the thin Ni{80}Fe{20} films are described that determine characteristics of intrinsic damping and the effects of intentionally created defects on linewidth. Measurements are made as a function of frequency with magnetization oriented in-plane and normal to the plane. For nominally uniform films, the ferromagnetic resonance linewidth is linear in frequency for both in-plane and normal magnetization and is well described by Landau-Lifshitz damping with a constant damping parameter. The effect of inhomogeneity was investigated by deposited the Ni{80}Fe{20} films on specially prepared substrates, one with parallel random grooves and one with polycrystalline, antiferromagnetic NiO. The linewidth in these samples is generally larger with magnetization in-plane than with magnetization normal. In the NiO/Ni{80}Fe{20} film the in-plane line width is linear in frequency with a significant zero-frequency linewidth. In the Ni80Fe20 sample on the grooved substrate, the linewidth has a more complicated frequency dependence.
Citation
Journal of Applied Physics
Volume
93
Issue
No 10 Part 2
Pub Type
Journals
Keywords
antiferromagnetic, ferromagentic resonance boradening, intrinsic damping, magnetization, Permalloy films
Twisselmann, D.
and McMichael, R.
(2003),
Intrinsic Damping and Intentional Ferromagnetic Resonance Broadening in Thin Permalloy Films, Journal of Applied Physics
(Accessed December 8, 2023)