Insights into transient photovoltage lifetimes via dark J-V analysis in perovskite solar cells

Published

September 23, 2024

Author(s)

Ganga Neupane, John Roller, Susanna Thon, Sheng Fu, Zhaoning Song, Yanfa Yan, Behrang Hamadani

Abstract

Transient photovoltage (TPV) decay measurements have commonly been used to estimate the charge carrier lifetimes in solar cell devices. However, it has recently been demonstrated that an intrinsic material property such as the effective bulk carrier lifetime can be severely masked by other device-related dynamics such as the composite resistance-capacitance (RC) discharge times, particularly at lower illumination intensities. In this work, we systematically investigate these issues by examining the role that the device's differential resistance plays on the TPV lifetimes as a function of the open circuit voltage. Using two different sets of perovskite solar cells, one of which was passivated through a special surface treatment chemistry, we clearly demonstrate that small differences in dark current density vs voltage (J-V) measurements are strongly correlated with TPV lifetime measurements in both devices. Using the two-diode recombination current model, we show that TPV lifetimes can be successfully predicted from a very fundamental, yet often overlooked, steady-state measurement technique.

Citation

Journal of Physical Chemistry C

Volume

128

Pub Type

Journals

Download Paper

https://doi.org/10.1021/acs.jpcc.4c04316

Local Download

Keywords

perovskite solar cells, photovoltaics, transient photovoltage, J-V curves, energy

Citation

Neupane, G. , Roller, J. , Thon, S. , Fu, S. , Song, Z. , Yan, Y. and Hamadani, B. (2024), Insights into transient photovoltage lifetimes via dark J-V analysis in perovskite solar cells, Journal of Physical Chemistry C, [online], https://doi.org/10.1021/acs.jpcc.4c04316, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=957730 (Accessed April 30, 2025)