Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Infinite-randomness criticality in monitored quantum dynamics with static disorder

Published

Author(s)

Aidan Zabalo, Justin Wilson, Michael Gullans, Romain Vasseur, Sarang Goplakrishnan, David Huse, Jed Pixley

Abstract

We consider a model of monitored quantum dynamics with quenched spatial randomness: specifically, random quantum circuits with spatially varying measurement rates. These circuits undergo a measurement-induced phase transition (MIPT) in their entanglement structure, but the nature of the critical point differs drastically from the case with constant measurement rate. In particular, at the critical measurement rate, we find that the entanglement of a subsystem of size l scales as S\sqrtl}; moreover, the dynamical critical exponent z =\infty. The MIPT is flanked by Griffiths phases with continuously varying dynamical exponents. We argue for this infinite-randomness scenario on general grounds and present numerical evidence that it captures some features of the universal criti- cal properties of MIPT using large-scale simulations of Clifford circuits. These findings demonstrate that the relevance and irrelevance of perturbations to the MIPT can naturally be interpreted using a powerful heuristic known as the Harris criterion.
Citation
Physical Review B
Volume
107
Issue
22

Keywords

Quantum dynamics, critical phenomena, quantum error correction

Citation

Zabalo, A. , Wilson, J. , Gullans, M. , Vasseur, R. , Goplakrishnan, S. , Huse, D. and Pixley, J. (2023), Infinite-randomness criticality in monitored quantum dynamics with static disorder, Physical Review B, [online], https://doi.org/10.1103/PhysRevB.107.L220204, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=935724 (Accessed May 29, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created June 23, 2023, Updated July 20, 2023