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High Throughput Screening Tools for Thermoelectric Materials



Winnie K. Wong-Ng, Yonggao Yan, Makoto Otani, Joshua B. Martin, Kevin R. Talley, Sara C. Barron, David L. Carroll, C Hewitt, Howard Joress, Evans L. Thomas, Martin L. Green, Xinfeng Tang


A suite of complementary high-throughput screening systems for combinatorial films was developed at NIST to facilitate the search for efficient thermoelectric materials. These custom-designed capabilities include a facility for combinatorial thin film synthesis and a suite of tools for screening the Seebeck coefficient, electrical resistance (electrical resistivity), and thermal effusivity (thermal conductivity) of these films. The Seebeck coefficient and resistance are measured via custom-built automated apparatus at both ambient and high temperatures. Thermal effusivity is measured using a frequency domain thermoreflectance technique. This paper will discuss applications using these tools on representative thermoelectric materials, including combinatorial composition-spread films, conventional films, single crystals, and ribbons.
Journal of Electronic Materials


high throughput thermoelectric screening tools, applications, thermoelectric bulk materials and single crystals, combinatorial films


Wong-Ng, W. , Yan, Y. , Otani, M. , Martin, J. , Talley, K. , Barron, S. , Carroll, D. , Hewitt, C. , Joress, H. , Thomas, E. , Green, M. and Tang, X. (2014), High Throughput Screening Tools for Thermoelectric Materials, Journal of Electronic Materials (Accessed February 26, 2024)
Created December 4, 2014, Updated February 19, 2017