Wong-Ng, W.
, Yan, Y.
, Otani, M.
, Martin, J.
, Talley, K.
, Barron, S.
, Carroll, D.
, Hewitt, C.
, Joress, H.
, Thomas, E.
, Green, M.
and Tang, X.
(2014),
High Throughput Screening Tools for Thermoelectric Materials, Journal of Electronic Materials
(Accessed December 9, 2024)
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High Throughput Screening Tools for Thermoelectric Materials
Published
Author(s)
, Yonggao Yan, , , Kevin R. Talley, , David L. Carroll, C Hewitt, Howard Joress, Evans L. Thomas, , Xinfeng Tang
Abstract
A suite of complementary high-throughput screening systems for combinatorial films was developed at NIST to facilitate the search for efficient thermoelectric materials. These custom-designed capabilities include a facility for combinatorial thin film synthesis and a suite of tools for screening the Seebeck coefficient, electrical resistance (electrical resistivity), and thermal effusivity (thermal conductivity) of these films. The Seebeck coefficient and resistance are measured via custom-built automated apparatus at both ambient and high temperatures. Thermal effusivity is measured using a frequency domain thermoreflectance technique. This paper will discuss applications using these tools on representative thermoelectric materials, including combinatorial composition-spread films, conventional films, single crystals, and ribbons.Citation
Journal of Electronic Materials
Volume
44
Pub Type
Journals
Keywords
high throughput thermoelectric screening tools, applications, thermoelectric bulk materials and single crystals, combinatorial films
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 4, 2014, Updated February 19, 2017