Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

High throughput measurements of thermochromic behavior in V_{1-x}Nb_xO_2 combinatorial thin film libraries

Published

Author(s)

Sara C. Barron, Justin M. Gorham, Martin L. Green, Mitul P. Patel

Abstract

We describe the high-throughput characterization of near infrared thermochromism in V1-xNbxO2 combinatorial thin film libraries. The oxide thin film libraries are prepared with a VO2 crystal structure and a continuous gradient in composition from impurity concentrations of less than 1% to 45%. The thermochromic phase transition from monoclinic to tetragonal is characterized by the accompanying change in near infrared reflectance. With increasing Nb substitution, the transition temperature is depressed from 65°C to 27°C, as desirable for smart window applications. However, the magnitude of the reflectance change across the thermochromic transition is also reduced with increasing Nb film content. Data collection, handling, and analysis supporting thermochromic characterization are fully automated to achieve high throughput. Using this system, in 14 hours, temperature-dependent infrared reflectance can be measured at 165 arbitrary locations on a thin film combinatorial library; these measurements are analyzed for thermochromic transitions in minutes.
Citation
Journal of Combinatorial Chemistry
Volume
16
Issue
10

Keywords

thermochromics, metal-insulator transition, infrared reflectivity, thin film, combinatorial materials science

Citation

Barron, S. , Gorham, J. , Green, M. and Patel, M. (2014), High throughput measurements of thermochromic behavior in V_{1-x}Nb_xO_2 combinatorial thin film libraries, Journal of Combinatorial Chemistry, [online], https://doi.org/10.1021/co500064p (Accessed December 10, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created September 2, 2014, Updated November 10, 2018