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High resolution 17 keV to 75 keV backlighers for high energy density experiments

Published

Author(s)

Lawrence T. Hudson, H.S. Parks, B.R. Maddox, E. Giraldez, P. Hatchett, N. Izumi, M.H. Key, S. LePape, A. MacKinnon, A MacPhee, P.K. Patel, T.W. Phillips, B.A. Remington, John F. Seely, A. Tommasini, R. Town, J. Workman

Abstract

We have developed 17 keV to 75 keV 1-dimensional and 2-dimensional high-resolution (<10 m) radiography using high-intensity short pulse lasers. High energy K- sources are created by fluorescence from hot electrons interacting in the target material after irradiation by lasers with intensity IL > 1017 W/cm2. We have achieved high resolution point projection 1-dimensional and 2-dimensional radiography using micro-foil and micro-wire targets attached to low-Z substrate materials. The micro-wire size was 10 m x 10 m x 300 m on a 300 m x 300 m x 5 m CH substrate. The radiography performance was demonstrated using the Titan laser at LLNL. We observed that the resolution is dominated by the micro-wire target size and there is very little degradation from the plasma plume, implying that the high energy x-ray photons are generated mostly within the micro-wire volume. We also observe that there are enough K- 2 photons created with a 300 J, 1- , 40 ps pulse laser from these small volume targets, and that the signal-to-noise ratio is sufficiently high, for single shot radiography experiments. This unique technique will be used on future high energy density (HED) experiments at the new Ω-EP, ZR and NIF facilities.
Citation
Physics of Plasmas
Volume
15
Issue
072705-1

Keywords

fluorescence, lasers, radiography, photons

Citation

Hudson, L. , Parks, H. , Maddox, B. , Giraldez, E. , Hatchett, P. , Izumi, N. , Key, M. , LePape, S. , MacKinnon, A. , MacPhee, A. , Patel, P. , Phillips, T. , Remington, B. , Seely, J. , Tommasini, A. , Town, R. and Workman, J. (2008), High resolution 17 keV to 75 keV backlighers for high energy density experiments, Physics of Plasmas, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=842501 (Accessed May 19, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created November 6, 2008, Updated February 19, 2017