NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.
Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.
An official website of the United States government
Here’s how you know
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
High Field X-Ray Diffraction Studies on Gd5(Ge2-xFex)Si2 (x = 0.05 and 0.2)
Published
Author(s)
Jim L. Her, Keiichi Koyama, Kazuo Watanabe, Virgil Provenzano, F Fu, Robert D. Shull
Abstract
We performed the X-ray diffraction measurements in magnetic fields up to 5 T for Gd5(Ge1.95Fe0.05)Si2 and Gd5(Ge1.8Fe0.2)Si2 which are noted recently as related materials for magnetic refrigerants. With heating from 8 K, the matrix of Gd5(Ge1.95Fe0.05)Si2 shows clearly a structural transition from an orthorhombic to a monoclinic structure at the vicinity of the Curie temperature (TC = 276 K). On the other hand, the matrix of Gd5(Ge1.8Fe0.2)Si2 with the orthorhombic structure in ferromagnetic state shows two phases co-existence of the orthorhombic and the monoclinic structures above TC = 303 K, indicating that a small amount of the matrix participates in phase transformation. By applying magnetic fields, the monoclinic structure is suppressed but the orthorhombic structure is enhanced for both samples just above TC, which closely relates to the magnetization process.
Citation
Metallurgical and Materials Transactions A-Physical Metallurgy and Materials Science
ferromagnetic, magnetic refrigerants, monoclinic structure, orthorhombic, x-ray diffraction
Citation
Her, J.
, Koyama, K.
, Watanabe, K.
, Provenzano, V.
, Fu, F.
and Shull, R.
(2005),
High Field X-Ray Diffraction Studies on Gd<sub>5</sub>(Ge<sub>2-x</sub>Fe<sub>x</sub>)Si<sub>2</sub> (x = 0.05 and 0.2), Metallurgical and Materials Transactions A-Physical Metallurgy and Materials Science, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=853392
(Accessed October 16, 2025)