Karhu, E.
, Kahwaji, S.
, Robertson, M.
, Fritzche, H.
, Kirby, B.
, Majkrzak, C.
and Monchesky, T.
(2011),
Helical Magnetic Order in MnSi Thin Films, Physical Review B, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=908736
(Accessed April 20, 2024)
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Helical Magnetic Order in MnSi Thin Films
Published
Author(s)
E. A. Karhu, S. Kahwaji, M. D. Robertson, H. Fritzche, , , T. L. Monchesky
Abstract
We present a study of the magnetic structure of crystalline MnSi(111) thin films by molecular beam epitaxy. A combination of polarized neutron diffraction (PNR) and SQUID magnetometry show that the films have helical magnetic order with a pitch vector Q along the film normal. The spin wave stiffness is found to drop from A= 0.67 meV nm2 to 0.50 meV nm2 as the thickness increases from 11 nm to 40nm. The helix wavelength of 2π/Q = 13.9 + or-}nm that is independent of thickness is explained by a concomitant drop in A and the Dzyaloshinshii constant, D. PNR shows that the magnetic structure has both left and right-handed chiralities due to the presence of inversion domains observed by transmission electron mictroscopy.Citation
Physical Review B
Volume
84
Issue
6
Pub Type
Journals
Download Paper
Keywords
Neutron Reflectometry, magnetism
Citation
Created August 21, 2011, Updated October 12, 2021