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Helical Magnetic Order in MnSi Thin Films

Published

Author(s)

E. A. Karhu, S. Kahwaji, M. D. Robertson, H. Fritzche, Brian Kirby, Charles Majkrzak, T. L. Monchesky

Abstract

We present a study of the magnetic structure of crystalline MnSi(111) thin films by molecular beam epitaxy. A combination of polarized neutron diffraction (PNR) and SQUID magnetometry show that the films have helical magnetic order with a pitch vector Q along the film normal. The spin wave stiffness is found to drop from A= 0.67 meV nm2 to 0.50 meV nm2 as the thickness increases from 11 nm to 40nm. The helix wavelength of 2π/Q = 13.9 + or-}nm that is independent of thickness is explained by a concomitant drop in A and the Dzyaloshinshii constant, D. PNR shows that the magnetic structure has both left and right-handed chiralities due to the presence of inversion domains observed by transmission electron mictroscopy.
Citation
Physical Review B
Volume
84
Issue
6

Keywords

Neutron Reflectometry, magnetism

Citation

Karhu, E. , Kahwaji, S. , Robertson, M. , Fritzche, H. , Kirby, B. , Majkrzak, C. and Monchesky, T. (2011), Helical Magnetic Order in MnSi Thin Films, Physical Review B, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=908736 (Accessed February 24, 2024)
Created August 21, 2011, Updated October 12, 2021