Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Fourier Analysis Near-Field Polarimetry for Measurement of Local Optical Properties of Thin Films



Lori S. Goldner, Michael J. Fasolka, S Nougier, H P. Nguyen, Garnett W. Bryant, Jeeseong Hwang, K D. Weston, Kathryn L. Beers, A Urbas, Edwin L. Thomas


We present measurements of the local dichroism and birefringence of thin film specimens us ing techniques that combine near-field scanning optical microscopy (NSOM) and a novel polarization modulation (PM) polarimetry utilizing Fourier analysis of the detected intensity signal. Generally, quantitative near-field polarimetry is hampered by the optical anisotropy of NSOM probes. For exampl'dely used Al-coated pulled-fiber aperture probes typically exhibit a dichroism near 10%. Our analysis of aperture dichroism demonstrates that the usual techniques for nulling a PM polanimeter result in a non-zero redisual probe birefringence in the presence of a dichroic tip. However, we show that both dichroism and birefrin-ence of the sample can be determined if both the tip dichroism and birefringenceare explicitly measured and accounted for in the data. In addition, in thin films (
Applied Optics


birefringence, diblock copolymers dichroism, near-field scanning optical microscopy, NSOM, polarimetry, retardance, SNOM, sphenrulities, thin films


Goldner, L. , Fasolka, M. , Nougier, S. , Nguyen, H. , Bryant, G. , Hwang, J. , Weston, K. , Beers, K. , Urbas, A. and Thomas, E. (2003), Fourier Analysis Near-Field Polarimetry for Measurement of Local Optical Properties of Thin Films, Applied Optics (Accessed April 24, 2024)
Created July 1, 2003, Updated January 27, 2020