Focusing Multilayer Mirror Detection System for Carbon K Edge Soft X-Ray Absorption Spectroscopy

Published

March 1, 2002

Author(s)

Daniel A. Fischer, S Sambasivan, A Kuperman, Y Platonov, J L. Wood

Abstract

Fluorescence yield carbon K edge soft x-ray absorption measurements of mixed element samples are impeded by background scattered x-rays and fluorescence from non carbon atoms within the sample induced by the incident x-ray beam (first and higher orders). We describe a high efficiency near-normal incidence focusing multilayer mirror detection system for carbon K edge fluorescence yield softx-ray absorption spectroscopy. A spherical focusing multilayer mirror collects nearly 60 % of the available solid angle with a reflectivity of 6 % and a resolution of 2 % (dE/E) for carbon K radiation in combination with a high efficiency proportional counter detector. The focusing multilayer system is able to effectively discriminate the background fluorescence and scattered light signals originating at the sample during a carbon K edge soft x-ray absorption experiment. A signal to background ratio in excess of 100 is possible for very dilute carbon samples, enabling a whole new class of in-situ photon-in photon-out soft x-ray absorption measurements of carbon chemistry in catalysts to be made, even in a reactive chemical environment.

Citation

Review of Scientific Instruments

Volume

73

Issue

No. 3

Pub Type

Journals

Keywords

detectors, multilayers, NEXAFS, soft x-ray

Citation

Fischer, D. , Sambasivan, S. , Kuperman, A. , Platonov, Y. and Wood, J. (2002), Focusing Multilayer Mirror Detection System for Carbon K Edge Soft X-Ray Absorption Spectroscopy, Review of Scientific Instruments (Accessed January 18, 2025)