Bonevich, J.
, van, D.
and Josell, D.
(1999),
Face-Centered Cubic Titanium: An Artifact in Titanium/Aluminum Multilayers, Journal of Materials Research
(Accessed May 9, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Face-Centered Cubic Titanium: An Artifact in Titanium/Aluminum Multilayers
Published
Author(s)
, D van Heerden,
Abstract
The present investigation is the first comprehensive comparative study of x-ray diffraction (XRD) and transmission electron microscopy (TEM) results to address the important issue of fcc Ti formation in nanoscale multilayers Ti/Al multilayers with 7.2 and 5.2 nm composition modulation wavelengths were studied by reflection and transmission XRD as well as transmission electron diffraction (ED), high-resolution TEM, and energy-filtered TEM. Previous reports have claimed deposition of fcc Ti in multilayer systems. Our results demonstrate that the Ti in Ti/Al multilayers deposits in the hcp form and that fcc Ti is merely an artifact of producing specimens for cross-sectional TEM.Citation
Journal of Materials Research
Volume
14
Issue
No. 5
Pub Type
Journals
Keywords
aluminum, multilayer, thin film, titanium, transformation, transmission electron microscopy, x-ray diffraction
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created May 1, 1999, Updated February 17, 2017