Bonevich, J.
, van, D.
and Josell, D.
(1999),
Face-Centered Cubic Titanium: An Artifact in Titanium/Aluminum Multilayers, Journal of Materials Research
(Accessed December 13, 2024)
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Face-Centered Cubic Titanium: An Artifact in Titanium/Aluminum Multilayers
Published
Author(s)
, D van Heerden,
Abstract
The present investigation is the first comprehensive comparative study of x-ray diffraction (XRD) and transmission electron microscopy (TEM) results to address the important issue of fcc Ti formation in nanoscale multilayers Ti/Al multilayers with 7.2 and 5.2 nm composition modulation wavelengths were studied by reflection and transmission XRD as well as transmission electron diffraction (ED), high-resolution TEM, and energy-filtered TEM. Previous reports have claimed deposition of fcc Ti in multilayer systems. Our results demonstrate that the Ti in Ti/Al multilayers deposits in the hcp form and that fcc Ti is merely an artifact of producing specimens for cross-sectional TEM.Citation
Journal of Materials Research
Volume
14
Issue
No. 5
Pub Type
Journals
Keywords
aluminum, multilayer, thin film, titanium, transformation, transmission electron microscopy, x-ray diffraction
Citation
Issues
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Created May 1, 1999, Updated February 17, 2017