Extracting the electronic structure of light elements in bulk materials through a Compton scattering method in the readily accessible hard X-ray regime

Published

May 28, 2024

Author(s)

Veenavee Kothalawala, Tejas Guruswamy, orlando Quaranta, Umeshkumar Manibhai Patel, Andrey Yakovenko, keith taddei, Meiying Zhang, Kelsey Morgan, Joel Weber, Daikang Yan, Daniel Swetz, Ilja Makkonen, Hemantha Kumar Yeddu, Arun Bansil, Antonino Miceli, Johannes Nokelainen, Bernardo Barbiellini

Abstract

Our Compton profile measurements of Ti and TiH2 using readily available hard X-ray radiation at 27.5 keV, detected by both a Hitachi Vortex silicon-drift detector (SDD) and a high-resolution superconducting Transition-edge sensor (TES) array, are found to be in excellent accord with state-of-the-art Density Functional Theory (DFT) based calculations. The spherically averaged difference between the Compton profiles of TiH2 and Ti is well described by an inverted parabola, supporting an itinerant behavior of the electron gas screening the protons in the Ti matrix. Our experimental approach, validated by two different detectors, extends the applicability of Compton scattering technique to the readily accessible hard X-ray regime (below 30 keV). Our study suggests new possibilities for experiments at low-flux bending magnet synchrotron beamlines, and pave the way for the development of tabletop Compton experiments with X-ray tubes.

Citation

Applied Physics Letters

Pub Type

Journals

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https://doi.org/10.1063/5.0207375

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Citation

Kothalawala, V. , Guruswamy, T. , Quaranta, O. , Manibhai Patel, U. , Yakovenko, A. , Taddei, K. , Zhang, M. , Morgan, K. , Weber, J. , Yan, D. , Swetz, D. , Makkonen, I. , Kumar Yeddu, H. , Bansil, A. , Miceli, A. , Nokelainen, J. and Barbiellini, B. (2024), Extracting the electronic structure of light elements in bulk materials through a Compton scattering method in the readily accessible hard X-ray regime, Applied Physics Letters, [online], https://doi.org/10.1063/5.0207375, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=957759 (Accessed February 17, 2025)