Kampel, L.
, Simos, D.
, Kuhn, D.
and Kacker, R.
(2021),
An exploration of combinatorial testing-based approaches to fault localization for explainable AI, Annals of Mathematics and Artificial Intelligence, [online], https://doi.org/10.1007/s10472-021-09772-0
(Accessed December 1, 2024)