Experimental Design of NCSLI 2005 Josephson Voltage Standard Interlaboratory Comparison
Yi-hua D. Tang, Clark Hamilton, Harold Parks, David Deaver, Barry Wood
The National Conference of Standards Laboratories International (NCSLI) 2005 Josephson voltage standard (JVS) Interlaboratory Comparison (ILC) provides participating laboratories with a means of comparing dc voltage measurements in order to meet accreditation or contractual requirements, and to establish reliability, confidence, and improved system operation. Several changes in procedures are implemented in the 2005 JVS ILC. NIST, as the main pivot lab, will make comparisons with a set of 4 subset pivot labs using the NIST compact Josephson voltage standard (CJVS). NIST will ship the CJVS to a subset pivot lab and make a comparison with the subset pivot lab?s JVS in situ using a set of four Fluke 732B Zener standards as transfer standards. Each subset pivot lab is responsible for making comparison measurements with 3 participants using the same protocol as in the NCSLI JVS ILC 2002. In order to monitor the condition of the transfer Zener standards, they will be shipped back to the subset pivot lab for a second set of measurements. This ?daisy? pattern will be repeated with 4 comparisons between NIST and the subset pivot labs, and comparisons with about 12 additional participant labs using the transfer Zener standards. It is anticipated that this method will greatly reduce the uncertainties corresponding to the non-linear drift characteristics associated with the environmental and transportability effects of the transfer Zener standards.
compact Josephson voltage standard (CJVS), environmental effects, interlaboratory comparison (ILC), Josephson voltage standard (JVS), Measurement Assurance Program (MAP), uncertainty, Zener voltage standard
, Hamilton, C.
, Parks, H.
, Deaver, D.
and Wood, B.
Experimental Design of NCSLI 2005 Josephson Voltage Standard Interlaboratory Comparison, Measure: The Journal of Measurement Science, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31943
(Accessed December 6, 2023)