Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Electron-Impact Total Ionization Cross Sections of SFx (x = 1-5)

Published

Author(s)

M A. Ali, Karl Irikura, Yong Sik Kim

Abstract

Total cross sections for electron impact ionization are necessary quantities for numerical modeling of plasma chemistry and for quantitative mass-spectrometric gas analysis. Theoretical cross sections for SF, SF2, SF3, SF4, and SF5 are calculated by the recently developed binary-encounter- Bethe (BEB) model. The BEB model combines a modified form of the Mott cross section and the Bethe cross section. The results are compared with experimental cross sections for SF3 and SF5 free radicals. In view of the success of the BEB method for SF6 and many other molecules, it is expected that the results presented here will provide reliable total ionization cross sections for SFx, x = 1-5.
Citation
International Journal of Mass Spectrometry
Volume
201
Issue
No. 1-3

Keywords

cross section, electron impact, ionization, mass spectrometry, plasma modeling, theory

Citation

Ali, M. , Irikura, K. and Kim, Y. (2000), Electron-Impact Total Ionization Cross Sections of SF<sub>x</sub> (x = 1-5), International Journal of Mass Spectrometry (Accessed December 7, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created June 30, 2000, Updated October 12, 2021