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Electron beam induced current in the high injection regime



Paul M. Haney, Heayoung Yoon, Prakash Koirala, Robert W. Collins, Nikolai B. Zhitenev


Electron beam induced current (EBIC) is a powerful technique which measures the charge collection efficiency of photovoltaics with sub-micron spatial resolution. The exciting electron beam results in a high generation rate density of electron-hole pairs, which may drive the system into nonlinear regimes. An analytic model is presented which describes the material response when the total electron-hole pair generation rate exceeds the rate at which carriers are extracted by the photovoltaic cell, and charge accumulation and screening occur. The model provides a simple estimate of the onset of high injection in terms of the material resistivity and thickness, and provides a straightforward way to predict the EBIC lineshape in the high injection regime. The model is verified by comparing its predictions to numerical simulations in 1 and 2 dimensions. Features of the experimental data, such as the magnitude and position of maximum collection efficiency versus electron beam current, are consistent with the 3 dimensional model.


Haney, P. , Yoon, H. , Koirala, P. , Collins, R. and Zhitenev, N. (2015), Electron beam induced current in the high injection regime, Nanotechnology, [online], (Accessed April 20, 2024)
Created July 2, 2015, Updated November 10, 2018