Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Electron Attachment Cross Sections and Negative Ion States of SF6

Published

Author(s)

Loucas G. Christophorou, James K. Olthoff

Abstract

A comprehensive and critical assessment of published data on the total, dissociative, and nondissociative electron attachment cross sections for SF6 allowed us to recommend or suggest room temperature values for these cross sections over an energy range from 0.0001 eV to 15 eV. The total electron attachment cross section is dominated by the formation of SF66u-^ below approximately equal to}0.2 eV, by the formation of SF5- between approximately equal to}0.3 eV and 1.5 eV, and by the formation of F- beyond approximately equal to}2.0 eV. This work, along with electron scattering and theoretical data, allowed us also to identify the energies and symmetry assignments of the negative ion states of SF6 below approximately equal to}15 eV.
Citation
International Journal of Mass Spectrometry

Keywords

dissociative attachment, electron attachment, electron scattering, negative ion states, SF<sub>6</sub>, sulfur hexafluoride

Citation

Christophorou, L. and Olthoff, J. (2001), Electron Attachment Cross Sections and Negative Ion States of SF6, International Journal of Mass Spectrometry, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=11326 (Accessed April 22, 2024)
Created December 31, 2000, Updated October 12, 2021