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PUBLICATIONS

Electromagnetically Induced Transparency (EIT) and Autler-Townes (AT) splitting in the Presence of Band-Limited White Gaussian Noise

Published

Author(s)

Christopher L. Holloway, Joshua A. Gordon, Matthew T. Simons, Marcus D. Kautz

Abstract

We investigate the effect of band-limited white Gaussian noise (BLWGN) on electromagnetically induced transparency (EIT) and Autler-Townes (AT) splitting, when performing atom-based continuous-wave (CW) radio- frequency (RF) electric (E) field strength measurements in Rydberg atomic vapor. This EIT/AT- based E-field measurement approach is currently being investigated by several groups around the world as a means to develop a new SI traceable RF E-field measurement technique. For this to be a useful technique, it is important to understand the influence of BLWGN. We perform EIT/AT based E-field experiments with BLWGN center around the RF transition and experiments for the BLWGN blue-shifted and red-shifted relative to the RF transition frequency. The EIT signal can be severely distorted for certain noise conditions (band-width, center- frequency, and noise power), hence altering the abilities to measure a CW RF E-field strength. We present a model to predict the changes in the EIT signal in the presence of noise. This model including AC Stark shifts and on resonance transitions associated with the noise source. The results of this model are compared to the experimental data, and we show very good agreement between the two.
Citation
Journal of Applied Physics
Pub Type
Journals

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Keywords

Rydberg atom, Electromagnetically Induced Transparency (EIT), Autler-Townes (AT), E-feild measurements, Gaussian noise
Electromagnetics

Citation

Holloway, C. , Gordon, J. , Simons, M. and Kautz, M. (2018), Electromagnetically Induced Transparency (EIT) and Autler-Townes (AT) splitting in the Presence of Band-Limited White Gaussian Noise, Journal of Applied Physics, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=924806 (Accessed October 11, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created May 31, 2018, Updated March 7, 2019