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Electrical Characterization of Narrow Gap n-Type Bulk HgCdTe Single Crystals by Variable-Magnetic-Field Hall Measurements and Reduced Conductivity-Tensor Analyses

Published

Author(s)

Jin S. Kim, David G. Seiler, R. A. Lancaster, M. B. Reine
Proceedings Title
Extended Abstracts of the 1995 U.S. Workshop on the Physics and Chemistry of Mercury Cadmium Telluride and Other IR Materials
Conference Dates
October 10-12, 1994
Conference Location
Baltimore, MD, USA

Citation

Kim, J. , Seiler, D. , Lancaster, R. and Reine, M. (1994), Electrical Characterization of Narrow Gap n-Type Bulk HgCdTe Single Crystals by Variable-Magnetic-Field Hall Measurements and Reduced Conductivity-Tensor Analyses, Extended Abstracts of the 1995 U.S. Workshop on the Physics and Chemistry of Mercury Cadmium Telluride and Other IR Materials, Baltimore, MD, USA (Accessed April 20, 2024)
Created December 30, 1994, Updated October 12, 2021