Elastic-Strain Tensor by Rietveld Refinement of Diffraction Measurements
Davor Balzar, R B. Voneele, K Bennett, H M. Ledbetter
By collecting diffraction patterns at different specimen orientations, the procedure to obtain all components of the elastic-strain tensor by Rietveld refinement is described. It is shown that the refined lattice parameters yield the hydrostatic strain component. if the lattice constants of the unstrained standard are not known, the deviatoric strain tensor can still be determined. An anisotropic strain component may be refined for cubic and hexagonal crystal structures along with the isotropic. The method is applied to Al/SiC (short whisker) composites.