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Efficient Dithering Technique with Periodic Waveforms for RF Test and Characterization

Published

Author(s)

Catherine A. Remley, Saeed Farsi, Bart Nauwelaers, Dominique Schreurs

Abstract

A dithering technique based on ensemble averaging of waveforms is proposed. In the proposed method, instead of performing several measurements with different dithering additive noise, a single measurement of multiple periods of a sine-dithered periodic waveform is used. The measured waveform is then segmented and the segments are averaged to obtain a noise-reduced post-processed waveform. This technique provides improved efficiency in test and characterization applications where accuracy higher than that of the built-in data converters of the measurement equipment is required. Moreover, it is shown that by using large dithering signals in the proposed technique, one can reduce the non-ideal effects in real applications. The measured reduction in the adjacent channel power of a modulated signal emanating from an arbitrary waveform generator supports the effectiveness of the approach.
Citation
IEEE Transactions on Microwave Theory and Techniques
Volume
61
Issue
11

Keywords

Analog-to-digital converter (ADC), digital-to-analog converter (DAC), dithering, ensemble averaging, modulated-signal measurement, quantization noise, wireless system test.

Citation

Remley, C. , Farsi, S. , Nauwelaers, B. and Schreurs, D. (2013), Efficient Dithering Technique with Periodic Waveforms for RF Test and Characterization, IEEE Transactions on Microwave Theory and Techniques, [online], https://doi.org/10.1109/TMTT.2013.2283847 (Accessed May 24, 2024)

Issues

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Created October 7, 2013, Updated January 27, 2020