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Efficiency of quasiparticle evacuation in superconducting devices

Published

Author(s)

Sukumar Rajauria, L. Pascal, P. Gandit, F. Hekking, B. Pannetier, H. Courtois

Abstract

We have studied the di®usion of excess quasiparticles in a current-biased superconductor strip in proximity to a metallic trap junction. In particular, we have measured accurately the superconductor temperature at a near-gap injection voltage. By analyzing our data quantitatively, we provide a full description of the spatial distribution of excess quasiparticles in the superconductor. We show that a metallic trap junction contributes signi¯cantly to the evacuation of excess quasiparticles.
Citation
Physical Review B
Volume
85
Issue
2

Citation

Rajauria, S. , Pascal, L. , Gandit, P. , Hekking, F. , Pannetier, B. and Courtois, H. (2012), Efficiency of quasiparticle evacuation in superconducting devices, Physical Review B, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=908584 (Accessed February 28, 2024)
Created January 23, 2012, Updated February 19, 2017