Effect of Subsurface Defects on the Surface Topography of Additive Manufactured Components

Published

July 25, 2018

Author(s)

Zachary C. Reese, Jason C. Fox, Felix H. Kim, John Taylor, Christopher Evans

Abstract

Additive manufactured (AM) components exhibit an abundance of surface textures and patterns. Past work investigating components created through laser powder bed fusion (LPBF) has shown that these patterns, specifically the chevron resulting from solidification of the melt pool on upward facing surfaces, can be correlated to quality of the final part [1]. Additionally, these patterns as well as the scan tracks have been observed to vary around the region of potential subsurface defects based on flash thermography data. This work explores parts with seeded subsurface defects at various depths from the top surface are printed in nickel alloy 625 on a commercially available LPBF machine. Surface height maps are obtained using a scanning white light interferometer (SWLI) to determine the defect's impact on the surface texture of subsequent layers. Data obtained from the SWLI are aligned with data from X-ray computed tomography (XCT) to confirm the locations of defects and applicability of this approach as an in-situ detection method is discussed.

Proceedings Title

Proceedings of the 2018 ASPE and euspen Summer Topical Meeting - Advancing Precision in Additive Manufacturing

Volume

69

Conference Dates

July 22-25, 2018

Conference Location

Berkeley, CA

Conference Title

2018 ASPE and euspen Summer Topical Meeting - Advancing Precision in Additive Manufacturing

Pub Type

Conferences

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Keywords

additive manufacturing, surface texture, defects

Citation

Reese, Z. , Fox, J. , Kim, F. , Taylor, J. and Evans, C. (2018), Effect of Subsurface Defects on the Surface Topography of Additive Manufactured Components, Proceedings of the 2018 ASPE and euspen Summer Topical Meeting - Advancing Precision in Additive Manufacturing, Berkeley, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=926281 (Accessed December 7, 2024)