Effect of strain, magnetic field and field angle on the critical current density of YBa2Cu3O7-δ coated conductors

Published

May 18, 2010

Author(s)

Daniel C. van der Laan, J. F. Douglas, John (Jack) W. Ekin, Loren F. Goodrich, Theodore C. Stauffer, Cameron C. Clickner

Abstract

A large, magnetic-field-dependent, reversible reduction in critical current density with axial strain in YBa₂Cu₃O_7-δ coated conductors at 75.9 K has been measured. This effect may have important implications for the performance of YBa₂Cu₃O_7-δ coated conductors in applications where the conductor experiences large stresses in the presence of a magnetic field. Previous studies have been performed only under tensile strain and could provide only a limited understanding of the in-field strain effect. We now have constructed a device for measuring the critical current density as a function of axial compressive and tensile strain and applied magnetic field as well as magnetic field angle, in order to determine the magnitude of this effect and to create a better understanding of its origin. The reversible reduction in critical current density with strain becomes larger with increasing magnetic field at all field angles. At 76 K the critical current density is reduced by about 30% at −0.5% strain when a magnetic field of 5 T is applied parallel to the c-axis of the conductor or 8 T is applied in the ab-plane, compared to a reduction of only 13% in self-field. Differences in the strain response of the critical current density at various magnetic field angles indicate that the pinning mechanisms in YBa₂Cu₃O_7-δ coated conductors are uniquely affected by strain.

Citation

Superconductor Science & Technology

Volume

23

Pub Type

Journals

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Keywords

YBCO coated conductors, critical current, strain, magnetic field

Citation

van, D. , Douglas, J. , W., J. , Goodrich, L. , Stauffer, T. and Clickner, C. (2010), Effect of strain, magnetic field and field angle on the critical current density of YBa₂Cu₃O_7-δ coated conductors, Superconductor Science & Technology, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=905079 (Accessed April 19, 2024)