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Domain Pinning in Lead Zirconate Titanate Thin Films

Published

Author(s)

J Blendell, Grady S. White

Abstract

Atomic force microscopy measurements of the piezoelectric response of a lead zirconate titanate (PZT) thin film detect domain pinning sites along grain boundaries. The locations of these sites are reproducible and 180 degrees domains appear to extend from or shrink into them. These results are interpreted in terms of grain misorientation-induced residual stresses playing a major role in domain pinning in PZT thin films.
Citation
Applied Physics Letters

Keywords

domain, ferroelectric, orientation, pinning, PZT, residual stress

Citation

Blendell, J. and White, G. (2017), Domain Pinning in Lead Zirconate Titanate Thin Films, Applied Physics Letters (Accessed April 18, 2024)
Created February 19, 2017