Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Domain Pinning in Lead Zirconate Titanate Thin Films



J Blendell, Grady S. White


Atomic force microscopy measurements of the piezoelectric response of a lead zirconate titanate (PZT) thin film detect domain pinning sites along grain boundaries. The locations of these sites are reproducible and 180 degrees domains appear to extend from or shrink into them. These results are interpreted in terms of grain misorientation-induced residual stresses playing a major role in domain pinning in PZT thin films.
Applied Physics Letters


domain, ferroelectric, orientation, pinning, PZT, residual stress


Blendell, J. and White, G. (2017), Domain Pinning in Lead Zirconate Titanate Thin Films, Applied Physics Letters (Accessed April 18, 2024)
Created February 19, 2017