Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Direct time-domain observation of attosecond final-state lifetimes in photoemission from solids

Published

Author(s)

Zhensheng Tao, Cong Chen, Tibor Szilvasi, Mark W. Keller, Manos Mavrikakis, Henry C. Kapteyn, Margaret M. Murnane

Abstract

Attosecond spectroscopic techniques have made it possible to measure differences in transport times for photoelectrons from localized core levels and delocalized valence bands in solids. We report the application of attosecond pulse trains to directly and unambiguously measure the difference in lifetimes between photoelectrons born into free electron-like states and those excited into unoccupied excited states in the band structure of nickel (111). An enormous increase in lifetime of 212 +/- 30 attoseconds occurs when the final state coincides with a short-lived excited state. Moreover, a strong dependence of this lifetime on emission angle is directly related to the final-state band dispersion as a function of electron transverse momentum. This finding underscores the importance of the material band structure in determining photoelectron lifetimes and corresponding electron escape depths.
Citation
Science/AAAS
Volume
353
Issue
6294

Keywords

attosecond, spectroscopic techniques, photoelectrons, localized core levels, localized core levels, pulse trains, nickel, electron transverse momentum, material band structure, electron escape depths

Citation

Tao, Z. , Chen, C. , Szilvasi, T. , Keller, M. , Mavrikakis, M. , Kapteyn, H. and Murnane, M. (2016), Direct time-domain observation of attosecond final-state lifetimes in photoemission from solids, Science/AAAS, [online], https://doi.org/10.1126/science.aaf6793, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=920477 (Accessed June 17, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created June 30, 2016, Updated October 12, 2021