Dielectric Sleeve Resonator Techniques for Microwave Complex Permittivity Evaluation

Published

October 1, 2001

Author(s)

Richard G. Geyer, Pavel Kabos, James R. Baker-Jarvis

Abstract

Closed-form analytical solutions are derived for accurate microwave dielectric characterization of rod test specimens inserted into dielectric sleeve resonators placed certrally in a metal cavity. Low-loss sleeve resonators can be used advantageously for multiple frequency measurements of the same specimen and may be employed for accurate dielectric characterization of high-permittivity specimens having dielectric loss factors greater than 0.001. Uncertainty relations for permittivity and dielectric loss are also shown, which demonstrates that when sample electric energy filling factors are greater than 0.4, relative uncertainties in measured permittivity and dielectric loss tangent are less than 1 % and 4 %, even for relative permittivities greater than 600. Example measurements are given that illustrate how this dielectric resonator system can be employed for dielectric characterization of ferroelectric materials at temperatures near or far from their Curie temperatures.

Citation

IEEE Transactions on Instrumentation and Measurement

Volume

51

Issue

2

Pub Type

Journals

Keywords

dielectric sleeve resonator, ferroelectric materials, loss tangent, microwave, permittivity

Citation

Geyer, R. , Kabos, P. and Baker-Jarvis, J. (2001), Dielectric Sleeve Resonator Techniques for Microwave Complex Permittivity Evaluation, IEEE Transactions on Instrumentation and Measurement (Accessed May 10, 2025)