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Dielectric Characterization of Ferroelectric Ceramics with Sleeve Resonator Techniques at Microwave Frequencies

Published

Author(s)

Richard G. Geyer, Pavel Kabos, James R. Baker-Jarvis

Abstract

Temperature-stable, high-Q sleeve resonators may be used for variable temperature dielectric characterization of rod-shaped ferroelectric test specimens at microwave frequencies. The nominal measurement frequency is determined by the permittivity and aspect ratio of the sleeve resonator. With several sleeve resonators having differing permittivities and aspect ratios but the same internal hole sizes, dielectric characterization of a single specimen over a wide frequency range may be performed using dominant TE011 mode structure. General theoretical considerations for dielectric sleeve resonators situated centrally in a cylindrical cavity and loaded with the specimen under test are given for arbitrary TEonp resonant mode structure. This technique is used for variable-temperature dielectric characterization of BaySr1-yTiO3(o<y<1) ceramic composites. Uncertainty analyses are provided that illustrate the influence of sample partial electric filling factor, sleeve geometry and complex permittivity, conductor losses, and measured system unloaded Q-factors on the specimen's evaluated dielectric properties.
Citation
Journal of the American Ceramic Society
Volume
131
Issue
1042-1122

Citation

Geyer, R. , Kabos, P. and Baker-Jarvis, J. (2003), Dielectric Characterization of Ferroelectric Ceramics with Sleeve Resonator Techniques at Microwave Frequencies, Journal of the American Ceramic Society (Accessed June 17, 2024)

Issues

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Created July 8, 2003, Updated January 27, 2020