Dielectric Characterization of Ferroelectric Ceramics with Sleeve Resonator Techniques at Microwave Frequencies

Published

July 8, 2003

Author(s)

Richard G. Geyer, Pavel Kabos, James R. Baker-Jarvis

Abstract

Temperature-stable, high-Q sleeve resonators may be used for variable temperature dielectric characterization of rod-shaped ferroelectric test specimens at microwave frequencies. The nominal measurement frequency is determined by the permittivity and aspect ratio of the sleeve resonator. With several sleeve resonators having differing permittivities and aspect ratios but the same internal hole sizes, dielectric characterization of a single specimen over a wide frequency range may be performed using dominant TE₀₁₁ mode structure. General theoretical considerations for dielectric sleeve resonators situated centrally in a cylindrical cavity and loaded with the specimen under test are given for arbitrary TE_onp resonant mode structure. This technique is used for variable-temperature dielectric characterization of Ba_ySr_1-yTiO₃(o<y<1) ceramic composites. Uncertainty analyses are provided that illustrate the influence of sample partial electric filling factor, sleeve geometry and complex permittivity, conductor losses, and measured system unloaded Q-factors on the specimen's evaluated dielectric properties.

Citation

Journal of the American Ceramic Society

Volume

131

Issue

1042-1122

Pub Type

Journals

Citation

Geyer, R. , Kabos, P. and Baker-Jarvis, J. (2003), Dielectric Characterization of Ferroelectric Ceramics with Sleeve Resonator Techniques at Microwave Frequencies, Journal of the American Ceramic Society (Accessed October 8, 2024)