Lowhorn, N.
, Wong-Ng, W.
, Lu, J.
, Martin, J.
, Green, M.
, Bonevich, J.
, Thomas, E.
, Dilley, N.
and Sharp, J.
(2011),
Development of a Seebeck Coefficient Standard Reference Material (SRM)™, Journal of Materials Research, [online], https://doi.org/10.1557/jmr.2011.118
(Accessed December 12, 2024)
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Development of a Seebeck Coefficient Standard Reference Material (SRM)
Published
Author(s)
, , , , , , , Neil Dilley, Jeff Sharp
Abstract
We have successfully developed a Seebeck coefficient Standard Reference Material (SRM), Bi2Te3, that is essential for interlaboratory data comparison and for instrument calibration. Certification measurements were performed using a differential steady-state (DC) technique on 10 samples (15 measurements)randomly selected from a batch of 390 bars. The certified Seebeck coefficient values are provided from 10 K to 390 K and they are further supported by transient (AC) measurements. The availability of this SRM will validate measurement results, leading to a better understanding of structure/property relationships and the underlying physics of potential high efficiency thermoelectric materials.Citation
Journal of Materials Research
Volume
26
Issue
15
Pub Type
Journals
Download Paper
Keywords
Low temperature Seebeck coefficient SRM, bismuth telluride, Steady-state (DC) technique, certification, instrument calibration
Citation
Issues
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Created July 31, 2011, Updated October 12, 2021