Development of Multilayer Analyzer Array Detectors for X-Ray Fluorescence at the Third Generation Synchrotron Source

Published

February 19, 2017

Author(s)

K Zhang, G Rosenbaum, R Liu, G Bunker, C Y. Liu, Daniel A. Fischer

Abstract

The development of Multilayer Analyzer Array Detector (MADD) for X-ray fluorescence is to eliminate the count rate limitation encountered with the multi-element Ge detector. A 24-element multilayer detector has been fabricated which is tunable in a large energy region. This detector has been operational for more than two years at the BioCAT Beamline of the Advanced Photon Source, Argonne National Lab. Here we report our recent progress in developing multilayer detectors working in lower energy region, in particular, its performance at Ca K fluorescence energy, and testing results at the soft x-ray energies. The band width of the analyzer response is found to be at 3-4% of the fluorescence energy. Namely, at the Ca K energy, the band width is 140 eV, it reduced to about 60 eV at A1 K fluorescence energy. The throughput of the detector in this energy region (1.5-3.6 KeV) is from 20 to 30%. These results demonstrated the feasibility for constructing multilayer analyzer array detector in the soft x-ray region.

Conference Dates

August 24-29, 2003

Conference Location

Undefined

Conference Title

SRI Conference

Pub Type

Conferences

Keywords

EXAFS, fluorescence detection, multilayer mirrors, NEXAFS

Citation

Zhang, K. , Rosenbaum, G. , Liu, R. , Bunker, G. , Liu, C. and Fischer, D. (2017), Development of Multilayer Analyzer Array Detectors for X-Ray Fluorescence at the Third Generation Synchrotron Source, SRI Conference, Undefined (Accessed September 10, 2024)