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Development of a combinatorial characterization scheme for high-throughput investigations of hydrogen storage materials.

Published

Author(s)

Jason Hattrick-Simpers, Z. Tan, H. Oguchi, Chun Chiu, Edwin J. Heilweil, James E. Maslar, Leonid A. Bendersky

Abstract

In order to reliably increase the throughput of materials measured for hydrogen storage properties, a complete high-throughput characterization scheme has been developed that accurately measures the hydrogen storage properties of materials in quantities ranging from 10 nanogram to 1 g. Initial identification of promising materials is realized by rapidly screening thin-film composition spread and thickness wedge samples using normalized IR emissivity imaging. The hydrogen storage properties of promising samples are confirmed through measurements on single composition films with a high sensitivity (resolution
Citation
Science and Technology of Advanced Materials
Volume
12
Issue
5

Keywords

high-throughput, hydrogen storage, spectroscopy
Created December 16, 2011, Updated November 10, 2018