Published: December 16, 2011
Jason Hattrick-Simpers, Z. Tan, H. Oguchi, Chun Chiu, Edwin J. Heilweil, James E. Maslar, Leonid A. Bendersky
In order to reliably increase the throughput of materials measured for hydrogen storage properties, a complete high-throughput characterization scheme has been developed that accurately measures the hydrogen storage properties of materials in quantities ranging from 10 nanogram to 1 g. Initial identification of promising materials is realized by rapidly screening thin-film composition spread and thickness wedge samples using normalized IR emissivity imaging. The hydrogen storage properties of promising samples are confirmed through measurements on single composition films with a high sensitivity (resolution < 0.3 ug) Sieverts type apparatus. For selected samples, larger quantities of up to ~ 100 mg may be prepared and their (de)hydrogenation/micro-structural properties probed via parallel in situ Raman spectroscopy. Final confirmation of the hydrogen storage properties of a sample are obtained on ~ 1 g powder quantities utilizing a combined Raman spectroscopy/Sieverts apparatus.
Citation: Science and Technology of Advanced Materials
Pub Type: Journals
high-throughput, hydrogen storage, spectroscopy
Created December 16, 2011, Updated November 10, 2018