Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Contactless Resonant Cavity Dielectric Spectroscopic Studies of Cellulosic Paper Aging

Published

Author(s)

Mary Kombolias, Jan Obrzut, Michael T. Postek, Dianne L. Poster, Yaw S. Obeng

Abstract

The current analytical techniques for characterizing printing and graphic arts substrates, particularly those used to date and to authenticate provenance, are largely ex situ and destructive. This limits the amount of data that can be captured from an individual sample. For samples being evaluated in forensic and archeological investigations, loss or degradation of some portion of unique and rare materials is also often a consequence, and it is difficult to produce statistically relevant data. In previous work, we developed a contactless resonant cavity dielectric spectroscopy technique that could be used for forensic and archeological investigations of paper. Measurements from this technique are suitable for statistical interpretations which offer analysts the ability to discriminate between sheeted paper material compositions. In this paper, we demonstrate how the contactless resonant cavity dielectric spectroscopy technique may be used to estimate the relative age of paper samples that are naturally and artificially aged
Citation
Analytical Letters
Volume
52
Issue
16

Keywords

microwave, dielectric spectroscopy, paper aging

Citation

Kombolias, M. , Obrzut, J. , Postek, M. , Poster, D. and Obeng, Y. (2019), Contactless Resonant Cavity Dielectric Spectroscopic Studies of Cellulosic Paper Aging, Analytical Letters, [online], https://doi.org/10.1080/00032719.2019.1655648, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=925776 (Accessed December 14, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created August 27, 2019, Updated October 12, 2021