Comparison of Time Base Nonlinearity Measurements Techniques
Gerard N. Stenbakken, J. P. Deyst
Distortions in the timebases of equivalent-time oscilloscopes and digitizers cause distortions of waveforms sampled by them. This paper reports on a comparison of two methods of characterizing timebase distortion, using pure sine-wave inputs of known frequency: the sinefit and the analytic signal methods. Simulations are used to compare the performance of the two methods versus different types of timebase distortion, different sine-wave frequencies, number of different sine-wave phases, levels of random noise, and levels of random jitter. The performance of the two methods varies considerably, dependent upon the input signal frequency and type of timebase distortion. Each method does much better than the other for certain cases.
IEEE Transactions on Instrumentation and Measurement
and Deyst, J.
Comparison of Time Base Nonlinearity Measurements Techniques, IEEE Transactions on Instrumentation and Measurement, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=21398
(Accessed September 30, 2023)