Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Combinatorial Test Generation for Multiple Input Models with Shared Parameters



Chang Rao, Nan Li, Yu Lei, Jin Guo, YaDong Zhang, Raghu N. Kacker, D. Richard Kuhn


Combinatorial testing typically considers a single input model and creates a single test set that achieves t-way coverage. This paper addresses the problem of combinatorial test generation for multiple input models with shared parameters. We formally define the problem and propose an efficient approach to generating multiple test sets, one for each input model, that together satisfy t-way coverage for all of these input models while minimizing the amount of redundancy between these test sets. We report an experimental evaluation that applies our approach to five real-world applications. The results show that our approach can significantly reduce the amount of redundancy between the test sets generated for multiple input models and perform better than a post-optimization approach.
IEEE Transactions on Software Engineering


Combinatorial Testing, T-way Test Generation, Multiple Input Models, Shared Parameters


Rao, C. , Li, N. , Lei, Y. , Guo, J. , Zhang, Y. , Kacker, R. and Kuhn, D. (2021), Combinatorial Test Generation for Multiple Input Models with Shared Parameters, IEEE Transactions on Software Engineering, [online],, (Accessed May 27, 2024)


If you have any questions about this publication or are having problems accessing it, please contact

Created March 17, 2021, Updated October 30, 2023