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Combinatorial Coverage Measurement Concepts and Applications

Published

Author(s)

David R. Kuhn, Itzel (. Dominquez Mendoza, Raghu N. Kacker, Yu Lei

Abstract

Empirical data demonstrate the value of t-way coverage, but in some testing situations, it is not practical to use covering arrays. However any set of tests covers at least some proportion of t-way combinations. This paper describes a variety of measures of combinatorial coverage that can be used in evaluating aspects of t-way coverage of a test suite. We also provide lower bounds on t-way coverage of several widely-used testing strategies, and describe a tool that analyzes test suites using the measures discussed in the paper.
Proceedings Title
Proceedings of the Sixth IEEE International Conference on Software, Testing, Verification and Validation (ICST 2013)
Conference Dates
March 18-22, 2013
Conference Location
Luxembourg
Conference Title
Second International Workshop on Combinatorial Testing

Keywords

component, combinatorial testing, factor covering array, state-space coverage, verification and validation (V&V), tway testing, configuration model, t-way testing

Citation

Kuhn, D. , Dominquez, I. , Kacker, R. and Lei, Y. (2013), Combinatorial Coverage Measurement Concepts and Applications, Proceedings of the Sixth IEEE International Conference on Software, Testing, Verification and Validation (ICST 2013), Luxembourg, -1, [online], https://doi.org/10.1109/ICSTW.2013.77 (Accessed July 2, 2022)
Created March 22, 2013, Updated November 10, 2018