Wiederhorn, S.
, Lopez-Cepero, J.
, Wallace, J.
, Guin, J.
and Fett, T.
(2017),
Characterization of the Mirror Region With Atomic Force Microscopy, Ceramic Transactions
(Accessed October 14, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Characterization of the Mirror Region With Atomic Force Microscopy
Published
Author(s)
, , , Jean-Pierre Guin, Theo Fett
Abstract
In this paper we use atomic force microscopy to investigate the roughness of the mirror region in silica glass. We demonstrate a decrease in surface RMS Roughness from about 0.5 nm to about 0.4 nm with increasing stress intensity factor (0.5KIc to about 0.95KIc). We believe the roughness to be a consequence of elastic interactions of the crack tip with nano scale inhomogeneities in the glass. These results contrast with the usual observation that roughness increases with distance as the crack propagates from the mirror region and into the mist and hackle regions. At low values of KI crack surfaces are relatively smooth. It is only when cracks approach KIc that the roughness builds up in silica glass leading to the expected transition in surface topography as the crack gets longer.Citation
Ceramic Transactions
Pub Type
Journals
Keywords
crack-growth, fractography, fracture, glass, RMS roughness, roughness
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created February 19, 2017