Anton, J.
and Hooker, S.
(2007),
Characterization of degradation mechanisms in neural recording electrodes, 2007 MRS Spring Proceedings, Symposiam U, San Francisco, CA, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=50538
(Accessed December 11, 2024)
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Characterization of degradation mechanisms in neural recording electrodes
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Author(s)
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Abstract
Understanding the nature of specific neural activity is essential to the progression of research in the field of brain disorders and diseases, as well as neuroprosthetics. Microelectrodes are the primary measurement devices used to transduce neural activity into electrical signals to help neuroscientists study dynamic brain function. Advances in signal processing and packaging currently allow neural recording with chronically implanted electrodes from freely behaving animals for periods as long as a year. Stability of the electrode impedance is required for optimum signal recording over the length of the recording interval. While electrode¿tissue interaction plays a major role in the quality of the recorded signal, delamination or degradation of the dielectric coating also interferes with signal recording. Therefore it is useful to understand how the electrode design and component materials affect the signal over the course of time to improve the signal recording process.Proceedings Title
2007 MRS Spring Proceedings, Symposiam U
Volume
1009E
Conference Dates
April 9-13, 2007
Conference Location
San Francisco, CA, USA
Conference Title
2007 MRS Spring Meeting
Pub Type
Conferences
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Keywords
microelectrode, neural recording, parylene
Citation
Issues
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Created July 31, 2007, Updated October 12, 2021