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Chapter 3. Extreme Impedance Measurements

Published

Author(s)

Pavel Kabos, Thomas Mitchell (Mitch) Wallis

Abstract

Microwave measurements of RF nanoelectronic devices present numerous challenges. Among these, perhaps the most difficult measurement challenge arises from the inherent, often extreme impedance mismatch between nanolectronic systems and conventional commercial test equipment. The physical origin of this mismatch may be understood by comparing two physical constants: the free space impedance and the resistance quantum.
Citation
Measurement Techniques for Radio Frequency Nanoelectronics
Publisher Info
Cambridge University Press, Cambridge, -1

Citation

Kabos, P. and Wallis, T. (2017), Chapter 3. Extreme Impedance Measurements, Cambridge University Press, Cambridge, -1, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=920581 (Accessed September 29, 2023)
Created September 14, 2017, Updated October 12, 2021