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Chapter 3. Extreme Impedance Measurements



Pavel Kabos, Thomas Mitchell (Mitch) Wallis


Microwave measurements of RF nanoelectronic devices present numerous challenges. Among these, perhaps the most difficult measurement challenge arises from the inherent, often extreme impedance mismatch between nanolectronic systems and conventional commercial test equipment. The physical origin of this mismatch may be understood by comparing two physical constants: the free space impedance and the resistance quantum.
Measurement Techniques for Radio Frequency Nanoelectronics
Publisher Info
Cambridge University Press, Cambridge, -1


Kabos, P. and Wallis, T. (2017), Chapter 3. Extreme Impedance Measurements, Cambridge University Press, Cambridge, -1, [online], (Accessed May 29, 2024)


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Created September 14, 2017, Updated October 12, 2021