Published: September 17, 2017
Thomas M. Wallis, Pavel Kabos
The topic of nanoscale magnetic systems is broad and could easily provide enough material for an entire book on its own. In this chapter, as in previous ones, we will focus on the nanoscale magnetic systems for which near-field scanning microwave microscope (NSMM) measurement systems offer characterization capabilities that are difficult to achieve by other measurement techniques. Note then that the scope of such systems extends beyond ferromagnetic materials alone. For example, two-dimensional electron gases (2DEGs) in semiconductors, interfaces between complex oxide layers, and low-dimensional materials are also of interest. While building toward a discussion of NSMM measurements of magnetization dynamics, we will also review several complementary, broadband measurement techniques for characterization of micro- and nano-magnetic systems. At present, these complementary techniques are more mature than NSMM and more widely applied to magnetic systems. These include all-electrical measurements and magnetomechanical measurement techniques based on microelectromechanical systems (MEMS).
Citation: Measurement Techniques for Radio Frequency Nanoelectronics
Publisher Info: Cambridge University Press, Cambridge, -1
Pub Type: Books
magnetization dynamics, nanoscale magnets, nanoscale electromagnetism, mangetic measurements
Created September 17, 2017, Updated May 02, 2018