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Certified Miniaturized Charpy Specimens for the Indirect Verification of Small-Size Impact Machines

Published

Author(s)

Enrico Lucon

Abstract

Small specimen test techniques are becoming ever more popular as the need increases to characterize mechanical properties by use of the smallest possible amount of material, due to various restrictions on material availability, irradiation, testing space, and other factors. The National Institute of Standards and Technology (NIST) is currently developing certified miniaturized Charpy V-notch (MCVN) specimens for the indirect verification of small-scale impact testing machines. The same materials used for NIST standard verification specimens are being evaluated at three energy levels (low, high and super-high). Two specimen types are being investigated, denominated KLST (from the German Kleinstprobe, or “small specimen”) and RHS (reduced half-size). Several instrumented impact tests on miniaturized KLST and RHS specimens of low, high and super high energy have been performed and analyzed. The variability of MCVN data has been compared to that of full-size Charpy data from the same lot of test specimens. Although this can be considered just the preliminary phase of this project, the results indicate that MCVN verification specimens can be used for the indirect verification of small-scale instrumented impact testers, both in terms of absorbed energy and maximum force. Additional aspects have also been investigated, such as the influence of shear lip symmetry and specimen fracture on absorbed energy and the correlation between miniaturized and full-size Charpy data.
Citation
Materials Performance and Characterization
Volume
2
Issue
1

Keywords

Indirect verification, KLST, MCVN, miniaturized Charpy specimens, RHS, small specimens, small-scale impact tester

Citation

Lucon, E. (2013), Certified Miniaturized Charpy Specimens for the Indirect Verification of Small-Size Impact Machines, Materials Performance and Characterization, [online], https://doi.org/10.1520/MPC20120031 (Accessed June 16, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created June 27, 2013, Updated November 10, 2018