Bottom Up Approaches to Improved Polyolefin Measurements

Published

February 4, 2016

Author(s)

Sara Orski, Thomas W. Rosch, Anthony Kotula, Richard J. Sheridan, Frederick R. Phelan Jr., Kalman Migler, Chad R. Snyder, Luis F. Vargas Lara, Jack F. Douglas, Kathryn L. Beers

Abstract

As a class of materials, polyolefins remain the largest production volume polymer in the world, as well as a highly desirable medium from which to engineer high performance and advanced properties for new applications. After decades of research, there are still major fundamental challenges to understanding the relationships between molecular structure, processing, morphology, and (ultimately) performance of these polymers. In two areas – surface adsorption for separation methods and melt crystallization – new tools and major advances in metrology are fueling a renewal of basic research into polyolefin characterization. Several approaches to these two problems, from theory and calculation to experimental models to elucidate each of these critical physical phenomena are undergoing current study at NIST.

Proceedings Title

SPE Polyolefins Conference 2016

Conference Dates

February 21-24, 2016

Conference Location

Houston, TX, US

Pub Type

Conferences

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Keywords

polyolefin, measurement science, x-ray reflectivity, Raman, ZENO, coarse-grain model

Citation

Orski, S. , Rosch, T. , Kotula, A. , Sheridan, R. , Phelan Jr., F. , Migler, K. , Snyder, C. , Vargas Lara, L. , Douglas, J. and Beers, K. (2016), Bottom Up Approaches to Improved Polyolefin Measurements, SPE Polyolefins Conference 2016, Houston, TX, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=919910 (Accessed October 9, 2025)