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A band-structure-based approach to modeling x-ray absorption, fluorescence, and resonant inelastic scattering, ed. by R.W. Dunford, D.S. Gemmell, E.P. Kanter, B. Kr {?}ssig, S.H. Southworth, and L. Young

Published

Author(s)

Eric L. Shirley, J A. Carlisle, Steven R. Blankenship, R N. Smith, L J. Terminello, J J. Jia, T A. Callcott, D L. Ederer
Citation
AIP Conf 506 X-Ray and Inner-Shell Processes
Publisher Info
AIP, Melville, NY

Citation

Shirley, E. , Carlisle, J. , Blankenship, S. , Smith, R. , Terminello, L. , Jia, J. , Callcott, T. and Ederer, D. (2000), A band-structure-based approach to modeling x-ray absorption, fluorescence, and resonant inelastic scattering, ed. by R.W. Dunford, D.S. Gemmell, E.P. Kanter, B. Kr {?}ssig, S.H. Southworth, and L. Young, AIP, Melville, NY (Accessed March 29, 2024)
Created January 1, 2000, Updated February 17, 2017