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A band-structure-based approach to modeling x-ray absorption, fluorescence, and resonant inelastic scattering, ed. by R.W. Dunford, D.S. Gemmell, E.P. Kanter, B. Kr {?}ssig, S.H. Southworth, and L. Young
Published
Author(s)
Eric L. Shirley, J A. Carlisle, Steven R. Blankenship, R N. Smith, L J. Terminello, J J. Jia, T A. Callcott, D L. Ederer
Citation
AIP Conf 506 X-Ray and Inner-Shell Processes
Publisher Info
AIP, Melville, NY
Pub Type
Books
Citation
Shirley, E.
, Carlisle, J.
, Blankenship, S.
, Smith, R.
, Terminello, L.
, Jia, J.
, Callcott, T.
and Ederer, D.
(2000),
A band-structure-based approach to modeling x-ray absorption, fluorescence, and resonant inelastic scattering, ed. by R.W. Dunford, D.S. Gemmell, E.P. Kanter, B. Kr {?}ssig, S.H. Southworth, and L. Young, AIP, Melville, NY
(Accessed October 8, 2025)