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Atomic flux circuits

Published

Author(s)

Douglas Bopp, Ellyse Taylor, Khoa Le, Susan Schima, Matthew Hummon, John Kitching

Abstract

Atomic vapors are a crucial platform for precision metrology but in their simplest implementation, a thermal vapor, the intrinsic optical resonances are broadened due to the random and isotropic thermal motion of the atoms. By structuring the container of a thermal vapor with narrow emission apertures, the velocity distribution can be modified to create a directed beam of atoms.1 These atomic beams can then interact sequentially with a series of optical fields, or interaction zones, and ultimately allow precision control over the internal state of the atom. This is useful for optical frequency standards and precision spectroscopy2, 3 and may also provide the means to build a simple flying qubit platform.4 Furthermore, atomic beams on a chip can be used as a compact, directed source to load magneto-optical traps (MOTs) while minimally increasing the ambient pressure.5 We apply microfabrication techniques to microscopically structure silicon to deterministically control the flow of Rb between connected cavities. We describe a methodology to measure the experimental parameters that govern the flux of atomic vapors in these microfabricated structures with a goal of creating an equivalent electrical circuit model. This toolkit will provide a simple platform for the creation of atomic beams on a chip with controllable pressure profiles and a thorough understanding of the influence of adsorptive effects and pseudo- ballistic trajectories on the resultant atomic beam.
Proceedings Title
Proceedings Volume 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II
Conference Dates
February 1-6, 2020
Conference Location
San Francisco, CA, US
Conference Title
SPIE Photonics WEST, OPTO

Keywords

rubidium, microfabrication, silicon

Citation

Bopp, D. , Taylor, E. , Le, K. , Schima, S. , Hummon, M. and Kitching, J. (2020), Atomic flux circuits, Proceedings Volume 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, San Francisco, CA, US (Accessed April 22, 2024)
Created February 22, 2020, Updated December 14, 2022